738 search results - page 56 / 148 » Workload-based optimization of integration processes |
CASES
2009
ACM
15 years 2 months ago
2009
ACM
Nanowire crossbar circuits are an emerging architectural paradigm that promises a higher integration density and an improved fault-tolerance due to its reconfigurability. In this...
ICPR
2010
IEEE
15 years 2 months ago
2010
IEEE
Maximizing passengers comfort is an important research topic in the domain of automotive systems engineering. In particular, an automatic adjustment of seat position according to d...
TCAD
2008
14 years 9 months ago
2008
Starting at the 65-nm node, stress engineering to improve the performance of transistors has been a major industry focus. An intrinsic stress source--shallow trench isolation (STI)...
130
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COST
2009
Springer
15 years 4 months ago
2009
Springer
In transparent optical networks as the signal propagates through a transparent network it experiences the impact of a variety of quality degrading phenomena that are introduced by ...
101
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DATE
2006
IEEE
15 years 3 months ago
2006
IEEE
For CMOS technologies below 65nm, gate oxide direct tunneling current is a major component of the total power dissipation. This paper presents a simulated annealing based algorith...