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» Yield prediction for 3D capacitive interconnections
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94
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ICCAD
2006
IEEE
137views Hardware» more  ICCAD 2006»
15 years 10 months ago
Yield prediction for 3D capacitive interconnections
Capacitive interconnections are very promising structures for high-speed and low-power signaling in 3D packages. Since the performance of AC links, in terms of Band-Width and Bit-...
Alberto Fazzi, L. Magagni, Mario de Dominicis, Pao...
106
Voted
DATE
2010
IEEE
156views Hardware» more  DATE 2010»
15 years 7 months ago
3D-integration of silicon devices: A key technology for sophisticated products
—3D integration is a key solution to the predicted performance increase of future electronic systems. It offers extreme miniaturization and fabrication of More than Moore product...
Armin Klumpp, Peter Ramm, R. Wieland