In this paper, a new built-in self-test structure to test the static specifications of analog to digital converters (ADCs) is presented. A ramp signal generated by an integrator ...
In this paper, we present a BIST scheme for testing onchip AD and DA converters. We discuss on-chip generation of linear ramps as test stimuli, and propose techniques for measurin...
Workflow technology has emerged as an appropriate platform for consolidating the distributed information resources of an enterprise, promoting interoperability across cross-platfo...
Annotated speech corpora are databases consisting of signal data along with time-aligned symbolic ‘transcriptions’. Such databases are typically multidimensional, heterogeneou...
While the B-tree (or the B+ -tree) is the most popular index structure in disk-based relational database systems, the Ttree has been widely accepted as a promising index structure...