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ICSE
2010
IEEE-ACM
15 years 9 months ago
Test generation through programming in UDITA
We present an approach for describing tests using nondeterministic test generation programs. To write such programs, we introduce UDITA, a Java-based language with non-determinist...
Milos Gligoric, Tihomir Gvero, Vilas Jagannath, Sa...
126
Voted
ITS
2010
Springer
157views Multimedia» more  ITS 2010»
15 years 9 months ago
A Computational Model of Accelerated Future Learning through Feature Recognition
Accelerated future learning, in which learning proceeds more effectively and more rapidly because of prior learning, is considered to be one of the most interesting measures of ro...
Nan Li, William W. Cohen, Kenneth R. Koedinger
SIGGRAPH
2010
ACM
15 years 9 months ago
A multi-layered display with water drops
We present a multi-layered display that uses water drops as voxels. Water drops refract most incident light, making them excellent wide-angle lenses. Each 2D layer of our display ...
Peter C. Barnum, Srinivasa G. Narasimhan, Takeo Ka...
SIGGRAPH
2010
ACM
15 years 9 months ago
Multi-scale image harmonization
Traditional image compositing techniques, such as alpha matting and gradient domain compositing, are used to create composites that have plausible boundaries. But when applied to ...
Kalyan Sunkavalli, Micah K. Johnson, Wojciech Matu...
ICDE
2010
IEEE
203views Database» more  ICDE 2010»
15 years 8 months ago
Optimizing ETL workflows for fault-tolerance
Extract-Transform-Load (ETL) processes play an important role in data warehousing. Typically, design work on ETL has focused on performance as the sole metric to make sure that the...
Alkis Simitsis, Kevin Wilkinson, Umeshwar Dayal, M...
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