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ASPDAC
2001
ACM
15 years 1 months ago
2001
ACM
Loical defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fails testing. In the la...
ASPDAC
2001
ACM
15 years 1 months ago
2001
ACM
Abstract--We present a processor-programmable built-in selftest (BIST) scheme suitable for embedded memory testing in the system-on-a-chip (SOC) environment. The proposed BIST circ...
ASPDAC
2001
ACM
15 years 1 months ago
2001
ACM
- This paper presents encoding techniques to optimize the switching activity on a multiplexed DRAM address bus. The DRAM switching activity can be classified either as external (be...
ASPDAC
2001
ACM
15 years 1 months ago
2001
ACM
Ethernet communication devices, such as adapter, hub, bridge and switch, all follow IEEE 802.3 standard protocol. We have designed and implemented an integrated 10/100 Mbps Etherne...
ASPDAC
2001
ACM
15 years 1 months ago
2001
ACM
In this paper, we o introduce the Reusable Embedded In-Circuit Emulator (EICE) and Reusable EICE development system. The main function in EICE we design are testing and debugging. ...