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112

ATS
2000
IEEE

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Functional Testing of Microprocessors with Graded Fault Coverage

15 years 10 months ago

Functional Testing of Microprocessors with Graded Fault Coverage

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Rajesh Kannah, C. P. Ravikumar

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92

ATS
2000
IEEE

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Testing in the Fourth Dimension

15 years 10 months ago

Testing in the Fourth Dimension

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Vishwani D. Agrawal, Kwang-Ting Cheng

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107

ATS
2000
IEEE

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Fast hierarchical test path construction for DFT-free controller-datapath circuits

15 years 10 months ago

Fast hierarchical test path construction for DFT-free controller-datapath circuits

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Yiorgos Makris, Jamison Collins, Alex Orailoglu

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130

ATS
2000
IEEE

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An adjacency-based test pattern generator for low power BIST design

15 years 10 months ago

An adjacency-based test pattern generator for low power BIST design

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Patrick Girard, Loïs Guiller, Christian Landr...

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110

ATS
2000
IEEE

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A new framework for static timing analysis, incremental timing refinement, and timing simulation

15 years 10 months ago

A new framework for static timing analysis, incremental timing refinement, and timing simulation

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Liang-Chi Chen, Sandeep K. Gupta, Melvin A. Breuer

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