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JECR
2002
13 years 6 months ago
2002
The fixed-income markets are enormous, however innovation in this sector has trailed that in the much smaller equities markets. Recently, a number of alternate trading systems (AT...
ATS
2002
IEEE
13 years 11 months ago
2002
IEEE
In this paper, we present a technique for reducing the test length of counter-based pseudo-exhaustive built-in self-testing (BIST) based on width compression method. More formally...
ATS
2002
IEEE
13 years 11 months ago
2002
IEEE
This paper addresses the problem of locating the stuckopen faults in a manufactured IC with scan flip-flops. Unlike most previous methods that only aim at identifying the faulty s...
ATS
2002
IEEE
13 years 11 months ago
2002
IEEE
We propose a methodology that examines design modules and identifies appropriate vector justification and response propagation requirements for hierarchical test. Based on a cel...
ATS
2002
IEEE
13 years 11 months ago
2002
IEEE
As the deep sub-micron techniques evolving, embedded memories are dominating the yield, while the testing and measurement issues are more difficult due to the access limitations. ...