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ICCAD
2005
IEEE
15 years 6 months ago
2005
IEEE
— Yield improvement through exploiting fault-free sections of defective chips is a well-known technique [1][2]. The idea is to partition the circuitry of a chip in a way that fau...
ISSRE
2005
IEEE
15 years 3 months ago
2005
IEEE
A classic question in software development is “H ow much testing is enough?” Aside from dynamic coverage-based metrics, there are few measures that can be used to provide guid...
ISCAS
2005
IEEE
15 years 3 months ago
2005
IEEE
— Program code size has become a critical design constraint of embedded systems. Large program codes require large memories, which increase the size and cost of the chip. Poor co...
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ICCV
2005
IEEE
15 years 11 months ago
2005
IEEE
Example-based learning of codes that statistically encode general image classes is of vital importance for computational vision. Recently, non-negative matrix factorization (NMF) ...
ICIP
2005
IEEE
15 years 3 months ago
2005
IEEE
Multiple description codes generated by quantized frame expansions have been shown to perform well on erasure channels when compared to traditional channel codes. In this paper we...