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60
Voted
COLT
2010
Springer
14 years 10 months ago
2010
Springer
67
Voted
COLT
2010
Springer
14 years 10 months ago
2010
Springer
102
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MICRO
2010
IEEE
14 years 10 months ago
2010
IEEE
Bias temperature instability, hot-carrier injection, and gate-oxide wearout will cause severe lifetime degradation in the performance and the reliability of future CMOS devices. Th...
91
Voted
COLT
2010
Springer
14 years 10 months ago
2010
Springer
Let S be an arbitrary measurable space, T R and (X, Y ) be a random couple in S
COLT
2010
Springer
14 years 10 months ago
2010
Springer
Abstract. We pose the problem of determining the rate of convergence at which AdaBoost minimizes exponential loss. Boosting is the problem of combining many "weak," high-...