2629 search results - page 325 / 526 » complex 2009 |
122
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DATE
2009
IEEE
15 years 11 months ago
2009
IEEE
—With continuous technology scaling, soft errors are becoming an increasingly important design concern even for earth-bound applications. While compiler approaches have the poten...
150
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DATE
2009
IEEE
15 years 11 months ago
2009
IEEE
Current trends in technology scaling foreshadow worsening transistor reliability as well as greater numbers of transistors in each system. The combination of these factors will so...
130
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DATE
2009
IEEE
15 years 11 months ago
2009
IEEE
— Today's innovations in the automotive sector are, to a great extent, based on electronics. The increasing integration complexity and stringent cost reduction goals turn E/...
137
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DATE
2009
IEEE
15 years 11 months ago
2009
IEEE
Abstract—Complex software programs are mostly characterized by phase behavior and runtime distributions. Due to the dynamism of the two characteristics, it is not efficient to m...
131
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DATE
2009
IEEE
15 years 11 months ago
2009
IEEE
— Heat removal and power delivery are two major reliability concerns in the 3D stacked IC technology. Liquid cooling based on micro-fluidic channels is proposed as a viable solu...