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VLSID
2002
IEEE
131views VLSI» more  VLSID 2002»
16 years 3 months ago
Divide-and-Conquer IDDQ Testing for Core-Based System Chips
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
C. P. Ravikumar, Rahul Kumar
VLSID
2002
IEEE
172views VLSI» more  VLSID 2002»
16 years 3 months ago
Improvement of ASIC Design Processes
With device counts on modern-day ASICs crossing the 10 million mark, careful planning of an ASIC design project is necessary to meet time deadlines. Two problems arise in this con...
Vineet Sahula, C. P. Ravikumar, D. Nagchoudhuri
VLSID
2002
IEEE
94views VLSI» more  VLSID 2002»
16 years 3 months ago
A Unified Method to Handle Different Kinds of Placement Constraints in Floorplan Design
In floorplan design, it is common that a designer will want to control the positions of some modules in the final packing for various purposes like data path alignment, I/O connec...
Evangeline F. Y. Young, Chris C. N. Chu, M. L. Ho
VLSID
2002
IEEE
122views VLSI» more  VLSID 2002»
16 years 3 months ago
IEEE 1394a_2000 Physical Layer ASIC
CN4011A is IEEE 1394a_2000 standard Compliant Physical Layer ASIC. It is a 0.18um mixed-signal ASIC incorporating three analog ports, PLL, reference generator for analog along wit...
Ranjit Yashwante, Bhalchandra Jahagirdar
VLSID
2002
IEEE
87views VLSI» more  VLSID 2002»
16 years 3 months ago
Simultaneous Circuit Transformation and Routing
In this paper, we propose a new methodology to integrate circuit transformation into routing. More specifically, this paper shows an approach for performing routing and wire recon...
Hiroaki Yoshida, Motohiro Sera, Masao Kubo, Masahi...