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177
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DAC
2004
ACM
15 years 10 months ago
2004
ACM
The high leakage current in nano-meter regimes is becoming a significant portion of power dissipation in CMOS circuits as threshold voltage, channel length, and gate oxide thickne...
183
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DAC
2004
ACM
15 years 10 months ago
2004
ACM
Random test generators are often used to create regression suites on-the-fly. Regression suites are commonly generated by choosing several specifications and generating a number o...
212
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DAC
2004
ACM
15 years 10 months ago
2004
ACM
This paper presents new technology that accelerates system verification. Traditional methods for verifying functional designs are based on logic simulation, which becomes more tim...
203
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DAC
2004
ACM
15 years 10 months ago
2004
ACM
In an attempt to enable the cost-effective production of lowand mid-volume application-specific chips, researchers have proposed a number of so-called structured ASIC architecture...
161
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DSN
2004
IEEE
15 years 10 months ago
2004
IEEE
The management of modern distributed systems is complicated by scale and dynamics. Scalable, decoupled communication establishes flexible, loosely coupled component relationships,...