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136
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EUROSYS
2006
ACM
16 years 8 days ago
2006
ACM
Run-time conflicts can affect even the most rigorously tested software systems. A reliance on execution-based testing makes it prohibitively costly to test every possible interac...
138
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ICCD
2006
IEEE
16 years 3 days ago
2006
IEEE
Technology trends are driving parallel on-chip architectures in the form of multi-processor systems-on-a-chip (MPSoCs) and chip multi-processors (CMPs). In these systems the incre...
124
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ICCAD
2006
IEEE
16 years 2 days ago
2006
IEEE
Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...
131
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ICCAD
2006
IEEE
16 years 2 days ago
2006
IEEE
In order to handle device matching in analog circuits, some pairs of modules are required to be placed symmetrically. This paper addresses this device-level placement problem for ...
137
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ICCAD
2006
IEEE
16 years 2 days ago
2006
IEEE
Process variations in modern VLSI technologies are growing in both magnitude and dimensionality. To assess performance variability, complex simulation and performance models param...