An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
Concurrent interaction of multi-processor systems result in errors which are difficult to find. Traditional simulationbased verification techniques remove the concurrency informat...
: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
Jing Li, Charles Augustine, Sayeef S. Salahuddin, ...
Achieving high performance under a peak temperature limit is a first-order concern for VLSI designers. This paper presents a new model of a thermally-managed system, where a stoch...
In this paper, a novel automatic approach for the concurrent topology and routing optimization that achieves a high quality network layout is proposed. This optimization is based ...