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121
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DATE
2010
IEEE
15 years 9 months ago
2010
IEEE
—With the advancement of CMOS manufacturing process to nano-scale, future shipped microprocessors will be increasingly vulnerable to intermittent faults. Quantitatively character...
154
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DATE
2010
IEEE
15 years 9 months ago
2010
IEEE
— Ubiquitous image processing tasks (such as transform decompositions, filtering and motion estimation) do not currently provide graceful degradation when their clock-cycles budg...
134
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DATE
2010
IEEE
15 years 9 months ago
2010
IEEE
—Temperature has a strong influence on integrated circuit (IC) performance, power consumption, and reliability. However, accurate thermal analysis can impose high computation co...
126
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DATE
2010
IEEE
15 years 9 months ago
2010
IEEE
—Recent developments have shown the possibility of leveraging silicon nanophotonic technologies for chip-scale interconnection fabrics that deliver high bandwidth and power effi...
117
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DATE
2010
IEEE
15 years 9 months ago
2010
IEEE
— Many CAD for VLSI problems can be naturally encoded as Quantified Boolean Formulas (QBFs) and solved with QBF solvers. Furthermore, such problems often contain circuitbased in...