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DAC
2007
ACM
16 years 24 days ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
DAC
2007
ACM
16 years 24 days ago
2007
ACM
With increasing time-to-market pressure and shortening semiconductor product cycles, more and more chips are being designed with library-based methodologies. In spite of this shif...
MICCAI
2007
Springer
16 years 22 days ago
2007
Springer
Ultrasound Myocardial Elastography (UME) and Tagged Magnetic Resonance Imaging (tMRI) are two imaging modalities that were developed in the recent years to quantitatively estimate ...
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SIGSOFT
2007
ACM
16 years 16 days ago
2007
ACM
Automated verification is a technique for establishing if certain properties, usually expressed in temporal logic, hold for a system model. The model can be defined using a high-l...
SIGSOFT
2007
ACM
16 years 16 days ago
2007
ACM
The fault-prone module detection in source code is of importance for assurance of software quality. Most of previous fault-prone detection approaches are based on software metrics...