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DAC
2004
ACM
15 years 3 months ago
Correct-by-construction layout-centric retargeting of large analog designs
Aggressive design cycles in the semiconductor industry demand a design-reuse principle for analog circuits. The strong impact of layout intricacies on analog circuit performance n...
Sambuddha Bhattacharya, Nuttorn Jangkrajarng, Roy ...
DAC
2004
ACM
15 years 3 months ago
Parametric yield estimation considering leakage variability
Leakage current has become a stringent constraint in today’s processor designs in addition to traditional constraints on frequency. Since leakage current exhibits a strong inver...
Rajeev R. Rao, Anirudh Devgan, David Blaauw, Denni...
DAC
2004
ACM
15 years 3 months ago
Hierarchical approach to exact symbolic analysis of large analog circuits
—This paper proposes a novel approach to the exact symbolic analysis of very large analog circuits. The new method is based on determinant decision diagrams (DDDs) representing s...
Sheldon X.-D. Tan, Weikun Guo, Zhenyu Qi
DAC
2004
ACM
15 years 3 months ago
Large-scale placement by grid-warping
Grid-warping is a new placement algorithm based on a strikingly simple idea: rather than move the gates to optimize their location, we elastically deform a model of the 2-0 chip s...
Zhong Xiu, James D. Z. Ma, Suzanne M. Fowler, Rob ...
DAC
2004
ACM
15 years 1 months ago
Leakage in nano-scale technologies: mechanisms, impact and design considerations
The high leakage current in nano-meter regimes is becoming a significant portion of power dissipation in CMOS circuits as threshold voltage, channel length, and gate oxide thickne...
Amit Agarwal, Chris H. Kim, Saibal Mukhopadhyay, K...