Sciweavers

    155 search results - page 20 / 31
    » dac 2006
    Sort
    View
    DAC
    2006
    ACM
    120views Computer Architecture» more  DAC 2006»
    Generation of yield-aware Pareto surfaces for hierarchical circuit design space exploration
    15 years 11 months ago
    Generation of yield-aware Pareto surfaces for hierarchical circuit design space exploration
    Download  www.ece.cmu.edu
    Pareto surfaces in the performance space determine the range of feasible performance values for a circuit topology in a given technology. We present a non-dominated sorting based ...
    Saurabh K. Tiwary, Pragati K. Tiwary, Rob A. Ruten...
    claim paper
    Read More »
    DAC
    2006
    ACM
    116views Computer Architecture» more  DAC 2006»
    Shielding against design flaws with field repairable control logic
    15 years 11 months ago
    Shielding against design flaws with field repairable control logic
    Download  www.eecs.umich.edu
    Correctness is a paramount attribute of any microprocessor design; however, without novel technologies to tame the increasing complexity of design verification, the amount of bugs...
    Ilya Wagner, Valeria Bertacco, Todd M. Austin
    claim paper
    Read More »
    DAC
    2006
    ACM
    130views Computer Architecture» more  DAC 2006»
    Predicate learning and selective theory deduction for a difference logic solver
    15 years 11 months ago
    Predicate learning and selective theory deduction for a difference logic solver
    Download  www.nec-labs.com
    Design and verification of systems at the Register-Transfer (RT) or behavioral level require the ability to reason at higher levels of abstraction. Difference logic consists of an...
    Chao Wang, Aarti Gupta, Malay K. Ganai
    claim paper
    Read More »
    DAC
    2006
    ACM
    132views Computer Architecture» more  DAC 2006»
    Criticality computation in parameterized statistical timing
    15 years 11 months ago
    Criticality computation in parameterized statistical timing
    Download  www.research.ibm.com
    Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...
    Jinjun Xiong, Vladimir Zolotov, Natesan Venkateswa...
    claim paper
    Read More »
    DAC
    2006
    ACM
    124views Computer Architecture» more  DAC 2006»
    Process variation aware OPC with variational lithography modeling
    15 years 11 months ago
    Process variation aware OPC with variational lithography modeling
    Download  www.cerc.utexas.edu
    Optical proximity correction (OPC) is one of the most widely used resolution enhancement techniques (RET) in nanometer designs to improve subwavelength printability. Conventional ...
    Peng Yu, Sean X. Shi, David Z. Pan
    claim paper
    Read More »
    Explore & Download
    Proceedings Preprints Top 5 Ranked Papers Publications Books Software Tutorials Presentations Lectures Notes Datasets
    Productivity Tools
    International On-screen Keyboard Graphical Social Symbols OCR Text Recognition CSS3 Style Generator Web Page to PDF Web Page to Image PDF Split PDF Merge Latex Equation Editor Sci2ools
    Document Tools
    PDF to Text PDF to Postscript PDF to Thumbnails Excel to PDF Word to PDF Postscript to PDF PowerPoint to PDF Latex to Word Repair Corrupted PDF
    Image Tools
    JPG to PS JPG to PDF Extract Images from PDF Image Converter
    Sciweavers
    About Community Cookies Privacy Policy Terms of Use

    Copyright © Sciweavers LLC, 2009-2025, USA.