VLSI engineers have traditionally used a variety of CAD analysis tools (e.g. SPICE) to deal with variability. As we go into deep sub micron issues, the analysis is becoming harder...
Sani R. Nassif, Vijay Pitchumani, N. Rodriguez, De...
With the advent of carbon nanotube technology, evaluating circuit and system performance using these devices is becoming extremely important. In this paper, we propose a quasi-ana...
Bipul C. Paul, Shinobu Fujita, Masaki Okajima, Tho...
How can design teams employ new tools and develop response methodologies yet still stay within design budgets? How much effort does it require to be an early adopter and what kind...
Shishpal Rawat, Raul Camposano, A. Kahng, Joseph S...
: Creating ICs in the nanometer age is a high-stakes race that few companies can afford to compete in – and even fewer can win. Hear how senior technologists from the world’s t...
G. Singer, Philippe Magarshack, Dennis Buss, F.-C....
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...