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DAC
2006
ACM
15 years 4 months ago
Variation-aware analysis: savior of the nanometer era?
VLSI engineers have traditionally used a variety of CAD analysis tools (e.g. SPICE) to deal with variability. As we go into deep sub micron issues, the analysis is becoming harder...
Sani R. Nassif, Vijay Pitchumani, N. Rodriguez, De...
DAC
2006
ACM
15 years 4 months ago
Modeling and analysis of circuit performance of ballistic CNFET
With the advent of carbon nanotube technology, evaluating circuit and system performance using these devices is becoming extremely important. In this paper, we propose a quasi-ana...
Bipul C. Paul, Shinobu Fujita, Masaki Okajima, Tho...
DAC
2006
ACM
15 years 4 months ago
DFM: where's the proof of value?
How can design teams employ new tools and develop response methodologies yet still stay within design budgets? How much effort does it require to be an early adopter and what kind...
Shishpal Rawat, Raul Camposano, A. Kahng, Joseph S...
DAC
2006
ACM
15 years 4 months ago
"The IC nanometer race -- what will it take to win?"
: Creating ICs in the nanometer age is a high-stakes race that few companies can afford to compete in – and even fewer can win. Hear how senior technologists from the world’s t...
G. Singer, Philippe Magarshack, Dennis Buss, F.-C....
DAC
2006
ACM
15 years 4 months ago
Modeling and minimization of PMOS NBTI effect for robust nanometer design
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
Rakesh Vattikonda, Wenping Wang, Yu Cao