102 search results - page 6 / 21 » date 1998 |
DATE
1998
IEEE
15 years 1 months ago
1998
IEEE
Functional scan chains are scan chains that have scan paths through a circuit's functional logic and flip-flops. Establishing functional scan paths by test point insertion (T...
DATE
1998
IEEE
15 years 1 months ago
1998
IEEE
Partial Scan techniques have been widely accepted as an effective solution to improve sequential ATPG performance while keeping acceptable area and performance overheads. Several ...
DATE
1998
IEEE
15 years 1 months ago
1998
IEEE
A new approach for sequential circuit test generation is proposed that combines software testing based techniques at the high level with test enhancement techniques at the gate le...
DATE
1998
IEEE
15 years 1 months ago
1998
IEEE
Simple disjunctive decomposition is a special case of logic function decompositions, where variables are divided into two disjoint sets and there is only one newly introduced vari...
CRYPTO
1998
Springer
15 years 1 months ago
1998
Springer
We state the basic requirements for time-stamping systems applicable as the necessary support to the legal use of electronic documents. We analyze the main drawbacks of the time-st...