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DATE
2003
IEEE
15 years 3 months ago
2003
IEEE
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
DATE
2003
IEEE
15 years 3 months ago
2003
IEEE
There are already a huge number of problems for silicon designers and it is likely to just get worse. Many of these problems are technical associated with shrinking geometries and...
DATE
2003
IEEE
15 years 3 months ago
2003
IEEE
In modern SoCs, embedded memories occupy the largest part of the chip area and include an even larger amount of active devices. As memories are designed very tightly to the limits...
DATE
2003
IEEE
15 years 3 months ago
2003
IEEE
A new method for selecting analog to digital (A/D) converters based on a generic figure of merit is described. First a figure of merit is introduced that includes both specific...
DATE
2003
IEEE
15 years 3 months ago
2003
IEEE
We present a framework that considers global routing, repeater insertion, and flip-flop relocation for early interconnect planning. We formulate the interconnect retiming and ...