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105
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DATE
2005
IEEE
15 years 10 months ago
2005
IEEE
A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns have greater ability to detect un-modeled defects. The propose...
130
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DATE
2005
IEEE
15 years 10 months ago
2005
IEEE
We present a novel, quality-driven, architectural-level approach that trades-off the output quality to enable power-aware processing of multimedia streams. The error tolerance of ...
135
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DATE
2005
IEEE
15 years 10 months ago
2005
IEEE
— This paper suggests a methodology to decrease the power of a static CMOS standard cell design at layout level by focusing on switched capacitance. The term switched is the key:...
137
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DATE
2005
IEEE
15 years 6 months ago
2005
IEEE
Transaction Level Modeling (TLM) approach is used to meet the simulation speed as well as cycle accuracy for large scale SoC performance analysis. We implemented a transaction-lev...
114
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PREMI
2005
Springer
15 years 9 months ago
2005
Springer
A considerable amount of research in case-based reasoning (CBR) has recently focused on conversational CBR as a means of providing more effective support for interactive problem ...