Sciweavers

453 search results - page 16 / 91
» date 2006
Sort
View
DATE
2006
IEEE
117views Hardware» more  DATE 2006»
15 years 4 months ago
Activity clustering for leakage management in SPMs
This paper we proposes compiler-based leakage optimization strategy for on-chip scratch-pad memories (SPMs). The idea is to keep only a small set of SPM regions active at a given ...
Mahmut T. Kandemir, Guangyu Chen, Feihui Li, Mary ...
DATE
2006
IEEE
141views Hardware» more  DATE 2006»
15 years 4 months ago
Evaluating coverage of error detection logic for soft errors using formal methods
—In this paper we describe a methodology to measure exactly the quality of fault-tolerant designs by combining faultinjection in high level design (HLD) descriptions with a forma...
Udo Krautz, Matthias Pflanz, Christian Jacobi 0002...
DATE
2006
IEEE
110views Hardware» more  DATE 2006»
15 years 4 months ago
Top-down heterogeneous synthesis of analog and mixed-signal systems
A new approach for automated synthesis of analog and mixed-signal systems is presented. The heterogeneous genetic optimization strategy starts from a functional description and ev...
Ewout Martens, Georges G. E. Gielen
DATE
2006
IEEE
105views Hardware» more  DATE 2006»
15 years 4 months ago
Optical routing for 3D system-on-package
Abstract— Optical interconnects enable faster signal propagation with virtually no crosstalk. In addition, wavelength division multiplexing allows a single waveguide to be shared...
Jacob R. Minz, Somaskanda Thyagaraja, Sung Kyu Lim
DATE
2006
IEEE
111views Hardware» more  DATE 2006»
15 years 4 months ago
Extraction of defect density and size distributions from wafer sort test results
Defect density and defect size distributions (DDSDs) are key parameters used in IC yield loss predictions. Traditionally, memories and specialized test structures have been used t...
Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jas...