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DATE
2006
IEEE
15 years 4 months ago
2006
IEEE
We present an approach to prevent overtesting in scan-based delay test. The test data is transformed with respect to functional constraints while simultaneously keeping as many po...
DATE
2006
IEEE
15 years 4 months ago
2006
IEEE
A concurrent core test approach is proposed to reduce the test cost of SOC. Multiple cores in SOC can be tested simultaneously by using a shared test set and scan chain disable. P...
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DATE
2006
IEEE
15 years 4 months ago
2006
IEEE
Quantum information processing technology is in its pioneering stage and no proficient method for synthesizing quantum circuits has been introduced so far. This paper introduces a...
DATE
2006
IEEE
15 years 4 months ago
2006
IEEE
Code size and energy consumption are critical design concerns for embedded processors as they determine the cost of the overall system. Techniques such as reduced length instructi...
DATE
2006
IEEE
15 years 4 months ago
2006
IEEE
We present a coverage metric which evaluates the testing of a set of interacting concurrent processes. Existing behavioral coverage metrics focus almost exclusively on the testing...