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WCE
2007
14 years 10 months ago
Performance Analysis of Job-Shop Production Systems under Different Order Release Control Parameters
—Controlling the flow of materials inside job-shops involves several decisions such as the acceptance or rejection of an incoming order, the order’s due date definition, the re...
Paulo S. A. Sousa, Maria R. A. Moreira
DATE
2007
IEEE
126views Hardware» more  DATE 2007»
15 years 4 months ago
Dynamic learning based scan chain diagnosis
Scan chain defect diagnosis is important to silicon debug and yield enhancement. Traditional simulationbased chain diagnosis algorithms may take long run time if a large number of...
Yu Huang
DATE
2007
IEEE
109views Hardware» more  DATE 2007»
15 years 4 months ago
Toward a scalable test methodology for 2D-mesh Network-on-Chips
1 This paper presents a BIST strategy for testing the NoC interconnect network, and investigates if the strategy is a suitable approach for the task. All switches and links in the ...
Kim Petersén, Johnny Öberg
DATE
2007
IEEE
71views Hardware» more  DATE 2007»
15 years 4 months ago
Task scheduling for reliable cache architectures of multiprocessor systems
This paper presents a task scheduling method for reliable cache architectures (RCAs) of multiprocessor systems. The RCAs dynamically switch their operation modes for reducing the ...
Makoto Sugihara, Tohru Ishihara, Kazuaki Murakami
DATE
2007
IEEE
91views Hardware» more  DATE 2007»
15 years 4 months ago
Remote testing and diagnosis of System-on-Chips using network management frameworks
This paper presents a new approach that allows remote testing and diagnosis of complex (Systems-on-Chip) and embedded IP cores. The approach extends both on-chip design-for-test (...
Oussama Laouamri, Chouki Aktouf