—Controlling the flow of materials inside job-shops involves several decisions such as the acceptance or rejection of an incoming order, the order’s due date definition, the re...
Scan chain defect diagnosis is important to silicon debug and yield enhancement. Traditional simulationbased chain diagnosis algorithms may take long run time if a large number of...
1 This paper presents a BIST strategy for testing the NoC interconnect network, and investigates if the strategy is a suitable approach for the task. All switches and links in the ...
This paper presents a task scheduling method for reliable cache architectures (RCAs) of multiprocessor systems. The RCAs dynamically switch their operation modes for reducing the ...
This paper presents a new approach that allows remote testing and diagnosis of complex (Systems-on-Chip) and embedded IP cores. The approach extends both on-chip design-for-test (...