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DATE
2007
IEEE
93views Hardware» more  DATE 2007»
15 years 4 months ago
Testing in the year 2020
Testing today of a several hundred million transistor System-on-Chip with analog, RF blocks, many processor cores and tens of memories is a huge task. What will test technology be...
Rajesh Galivanche, Rohit Kapur, Antonio Rubio
DATE
2007
IEEE
77views Hardware» more  DATE 2007»
15 years 4 months ago
Method for reducing jitter in multi-gigahertz ATE
Controlling jitter on a picosecond (or smaller) time scale has become one of the most difficult challenges for testing multi-gigahertz systems. In this paper we present a novel me...
David C. Keezer, Dany Minier, Patrice Ducharme
DATE
2007
IEEE
102views Hardware» more  DATE 2007»
15 years 4 months ago
A two-tone test method for continuous-time adaptive equalizers
This paper describes a novel test method for continuous-time adaptive equalizers. This technique applies a two-sinusoidal-tone signal as stimulus and includes an RMS detector for ...
Dongwoo Hong, Shadi Saberi, Kwang-Ting Cheng, C. P...
DATE
2007
IEEE
76views Hardware» more  DATE 2007»
15 years 4 months ago
Heterogeneous systems on chip and systems in package
This paper discusses several forms of heterogeneity in systems on chip and systems in package. A means to distinguish the various forms of heterogeneity is given, with an estimati...
I. O'Connor, B. Courtois, K. Chakrabarty, N. Delor...
GFKL
2007
Springer
166views Data Mining» more  GFKL 2007»
15 years 3 months ago
Classifying Number Expressions in German Corpora
Number and date expressions are essential information items in corpora and therefore play a major role in various text mining applications. However, so far number expressions were ...
Irene M. Cramer, Stefan Schacht, Andreas Merkel