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DATE
2007
IEEE
15 years 4 months ago
2007
IEEE
— We present a waveform based variational static timing analysis methodology. It is a timing paradigm that lies midway between convention static delay approximations and full dyn...
DATE
2007
IEEE
15 years 4 months ago
2007
IEEE
Combination of SECDED with a redundancy technique can effectively tolerate a high variation-induced defect rate in future processes. However, while a defective cell in a block can...
DATE
2007
IEEE
15 years 4 months ago
2007
IEEE
RFIC reliability is fast becoming a major bottleneck in the yield and performance of modern IC systems, as process complexity and levels of integration continually increase. Due t...
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DATE
2007
IEEE
15 years 4 months ago
2007
IEEE
High reliability against noise, low energy consumption and high performance are key objectives in the design of on-chip networks. Recently some researchers have considered the var...
DATE
2007
IEEE
15 years 4 months ago
2007
IEEE
∗ This paper presents an analysis of the electrical origins of Slow Write Driver Faults (SWDFs) [1] that may affect SRAM write drivers in 65nm technology. This type of fault is t...