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DATE
2007
IEEE
15 years 4 months ago
2007
IEEE
Abstract— The impact of process variations increases as technology scales to nanometer region. Under large process variations, the path and arc/node criticality [18] provide effe...
DATE
2007
IEEE
15 years 4 months ago
2007
IEEE
Extensive work has been done for optimal management of scratch-pad memory (SPM) all assuming that the SPM is assigned a fixed address space. The main target objects to be placed o...
69
Voted
DATE
2007
IEEE
15 years 4 months ago
2007
IEEE
—Increasing power density causes die overheating due to limited cooling capacity of the package. Conventional thermal management techniques e.g. logic shutdown, clock gating, fre...
DATE
2007
IEEE
15 years 4 months ago
2007
IEEE
One of the main tasks in analog design is the sizing of the circuit parameters, such as transistor lengths and widths, in order to obtain optimal circuit performances, such as hig...
59
Voted
DATE
2007
IEEE
15 years 4 months ago
2007
IEEE
An important aspect of Design for Yield for embedded SRAM is identifying the expected worst case behavior in order to guarantee that sufficient design margin is present. Previousl...