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DATE
2007
IEEE
15 years 4 months ago
2007
IEEE
Abstract— We present an SoC testing approach that integrates test data compression, TAM/test wrapper design, and test scheduling. An improved LFSR reseeding technique is used as ...
DATE
2007
IEEE
15 years 4 months ago
2007
IEEE
In this paper, we propose a novel statistical model order reduction technique, called statistical spectrum model order reduction (SSMOR) method, which considers both intra-die and...
DATE
2007
IEEE
15 years 4 months ago
2007
IEEE
Multiple asynchronous clock domains have been increasingly employed in System-on-Chip (SoC) designs for different I/O interfaces. Functional validation is one of the most expensiv...
DATE
2007
IEEE
15 years 4 months ago
2007
IEEE
Device scaling in new and future technologies brings along severe increase in the soft error rate of circuits, for combinational and sequential logic. Although potential solutions...
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DATE
2007
IEEE
15 years 4 months ago
2007
IEEE
Solid frameworks and toolkits for design and analysis of embedded systems are of high importance, since they enable early reasoning about critical properties of a system. This pap...