Sciweavers

501 search results - page 59 / 101
» date 2007
Sort
View
DATE
2007
IEEE
86views Hardware» more  DATE 2007»
15 years 4 months ago
Reduction of detected acceptable faults for yield improvement via error-tolerance
Error-tolerance is an innovative way to enhance the effective yield of IC products. Previously a test methodology based on error-rate estimation to support error-tolerance was pro...
Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer
DATE
2007
IEEE
173views Hardware» more  DATE 2007»
15 years 4 months ago
Architectural leakage-aware management of partitioned scratchpad memories
Partitioning a memory into multiple blocks that can be independently accessed is a widely used technique to reduce its dynamic power. For embedded systems, its benefits can be ev...
Olga Golubeva, Mirko Loghi, Massimo Poncino, Enric...
DATE
2007
IEEE
157views Hardware» more  DATE 2007»
15 years 4 months ago
Energy evaluation of software implementations of block ciphers under memory constraints
Software implementations of modern block ciphers often require large lookup tables along with code size increasing optimizations like loop unrolling to reach peak performance on g...
Johann Großschädl, Stefan Tillich, Chri...
DATE
2007
IEEE
143views Hardware» more  DATE 2007»
15 years 4 months ago
Portable multimedia SoC design: a global challenge
- The intrinsic capability brought by each new technology node opens the way to a broad range of system integration options and continuously enables new applications to be integrat...
Maurizio Paganini, Georg Kimmich, Stephane Ducrey,...
DATE
2007
IEEE
146views Hardware» more  DATE 2007»
15 years 4 months ago
DFM/DFY: should you trust the surgeon or the family doctor?
Everybody agrees that curing DFM/DFY issues is of paramount importance at 65 nanometers and beyond. Unfortunately, there is disagreement about how and when to cure them. “Surgeo...
Marco Casale-Rossi, Andrzej J. Strojwas, Robert C....