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110
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DATE
2008
IEEE
112views Hardware» more  DATE 2008»
15 years 7 months ago
Adaptive Simulation for Single-Electron Devices
Single-electron devices have drawn much attention in the last two decades. They have been widely used for device research and also show promise as a potential alternative to compl...
Nicholas Allec, Robert G. Knobel, Li Shang
89
Voted
DATE
2008
IEEE
78views Hardware» more  DATE 2008»
15 years 7 months ago
Simultaneous FU and Register Binding Based on Network Flow Method
– With the rapid increase of design complexity and the decrease of device features in nano-scale technologies, interconnection optimization in digital systems becomes more and mo...
Jason Cong, Junjuan Xu
94
Voted
DATE
2008
IEEE
122views Hardware» more  DATE 2008»
15 years 7 months ago
Digital bit stream jitter testing using jitter expansion
This paper presents a time-domain jitter expansion technique for high-speed digital bit sequence jitter testing. While jitter expansion has been applied to phase noise measurement...
Hyun Choi, Abhijit Chatterjee
DATE
2008
IEEE
157views Hardware» more  DATE 2008»
15 years 7 months ago
Clock Distribution Scheme using Coplanar Transmission Lines
The current work describes a new standing wave oscillator scheme aimed for clock propagation on coplanar transmission lines on a silicon die. The design is aimed for clock signali...
Victor H. Cordero, Sunil P. Khatri
82
Voted
DATE
2008
IEEE
119views Hardware» more  DATE 2008»
15 years 7 months ago
Process Variation Aware Issue Queue Design
In sub-90nm process technology it becomes harder to control the fabrication process, which in turn causes variations between the design-time parameters and the fabricated paramete...
Raghavendra K, Madhu Mutyam