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DATE
2008
IEEE
15 years 7 months ago
2008
IEEE
Leakage power is a serious concern in nanometer CMOS technologies. In this paper we focus on leakage reduction through automatic insertion of sleep transistors for power gating in...
DATE
2008
IEEE
15 years 7 months ago
2008
IEEE
Increasing reliability at a minimum amount of extra cost is a major challenge in todays ECU network design. Considering reliability as an objective already in early design phases ...
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DATE
2008
IEEE
15 years 7 months ago
2008
IEEE
Abstract— We present a general method to evaluate RF BuiltIn Self-Test (BIST) techniques during the design stage. In particular, the adaptive kernel estimator is used to construc...
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DATE
2008
IEEE
15 years 7 months ago
2008
IEEE
—Unencrypted data appearing on the processor– memory bus can result in security violations, e.g., allowing attackers to gather keys to financial accounts and personal data. Al...
DATE
2008
IEEE
15 years 7 months ago
2008
IEEE
— Market and customer demands have continued to push the limits of CMOS performance. At-speed test has become a common method to ensure these high performance chips are being shi...