438 search results - page 36 / 88 » date 2009 |
77
Voted
DATE
2009
IEEE
15 years 5 months ago
2009
IEEE
In the field of chip design, hardware module reuse is a standard solution to the increasing complexity of chip architecture and the pressures to reduce time to market. In the abs...
73
Voted
DATE
2009
IEEE
15 years 5 months ago
2009
IEEE
Negative Bias Temperature Instability (NBTI), a PMOS aging phenomenon causing significant loss on circuit performance and lifetime, has become a critical challenge for temporal re...
88
Voted
DATE
2009
IEEE
15 years 5 months ago
2009
IEEE
—Distributed systems, especially time-triggered ones, are implementing clock synchronization algorithms to provide and maintain a common view of time among the different nodes. S...
DATE
2009
IEEE
15 years 5 months ago
2009
IEEE
The single stuck-at fault coverage is often seen as a figure-of-merit also for scan testing according to other fault models like transition faults, bridging faults, crosstalk faul...
107
Voted
DATE
2009
IEEE
15 years 5 months ago
2009
IEEE
Abstract—The demand for embedded computing power is continuously increasing and FPGAs are becoming very interesting computing platforms, as they provide huge amounts of customiza...