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DATE
2009
IEEE
15 years 5 months ago
2009
IEEE
—The sustained push for performance, transistor count, and instruction level parallelism has reached a point where chip level power density issues are at the forefront of design ...
74
Voted
DATE
2009
IEEE
15 years 5 months ago
2009
IEEE
— During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including builti...
98
Voted
DATE
2009
IEEE
15 years 5 months ago
2009
IEEE
With the relentless scaling of semiconductor technology, the lifetime reliability of embedded multiprocessor platforms has become one of the major concerns for the industry. If th...
DATE
2009
IEEE
15 years 5 months ago
2009
IEEE
Abstract—Building highly optimized embedded systems demands hardware/software (HW/SW) co-design. A key challenge in co-design is the design of HW/SW interfaces, which is often a ...
DATE
2009
IEEE
15 years 5 months ago
2009
IEEE
— In this paper, we propose a novel, energy aware scheduling algorithm for applications running on DVS-enabled multiprocessor systems, which exploits variation in execution times...