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DATE
2009
IEEE
16 years 4 days ago
2009
IEEE
—During post-silicon processor debugging, we need to frequently capture and dump out the internal state of the processor. Since internal state constitutes all memory elements, th...
154
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DATE
2009
IEEE
15 years 9 months ago
2009
IEEE
As application complexity increases, modern embedded systems have adopted heterogeneous processing elements to enhance the computing capability or to reduce the power consumption. ...
152
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DATE
2009
IEEE
16 years 4 days ago
2009
IEEE
Abstract—Many application domains require adaptive realtime embedded systems that can change their functionality over time. In such systems it is not only necessary to guarantee ...
136
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DATE
2009
IEEE
16 years 4 days ago
2009
IEEE
—In modern sub-micron design, achieving low-skew clock distributions is facing challenges for high-performance circuits. Symmetric global clock distribution and clock tree synthe...
166
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DATE
2009
IEEE
2009
IEEE
Analyzing the impact of process variations on parametric measurements: Novel models and applications
16 years 4 days ago
Abstract—In this paper we propose a novel statistical framework to model the impact of process variations on semiconductor circuits through the use of process sensitive test stru...