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DATE
2009
IEEE
15 years 4 months ago
2009
IEEE
Abstract—With the increasing scaling of manufacturing technology, process variation is a phenomenon that has become more prevalent. As a result, in the context of Chip Multiproce...
71
Voted
DATE
2009
IEEE
15 years 4 months ago
2009
IEEE
– The quest for technologies with superior device characteristics has showcased Carbon Nanotube Field Effect Transistors (CNFETs) into limelight. Among the several design aspects...
DATE
2009
IEEE
15 years 4 months ago
2009
IEEE
—Core-cell stability represents the ability of the core-cell to keep the stored data. With the rapid development of semiconductor memories, their test is becoming a major concern...
66
Voted
DATE
2009
IEEE
15 years 4 months ago
2009
IEEE
Abstract—Chip multiprocessors (CMPs) present a unique scenario for software data prefetching with subtle tradeoffs between memory bandwidth and performance. In a shared L2 based ...
DATE
2009
IEEE
15 years 2 months ago
2009
IEEE
Nanometer CMOS scaling has resulted in greatly increased circuit variability, with extremely adverse consequences on design predictability and yield. A number of recent works have...