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DATE
2010
IEEE
15 years 4 months ago
2010
IEEE
We model and verify analog designs in the presence of noise and process variation using an automated theorem prover, MetiTarski. Due to the statistical nature of noise, we propose ...
DATE
2010
IEEE
15 years 1 months ago
2010
IEEE
Due to fast technology scaling, negative bias temperature instability (NBTI) has become a major reliability concern in designing modern integrated circuits. In this paper, we prese...
DATE
2010
IEEE
14 years 12 months ago
2010
IEEE
The Monte Carlo (MC) simulation is a well-known solution to the statistical analysis of analog circuits in the presence of device mismatch. Despite MC's superior accuracy comp...
DATE
2010
IEEE
15 years 4 months ago
2010
IEEE
Abstract—Today we can identify a big gap between requirement specification and the generation of test environments. This article extends the Classification Tree Method for Embe...
DATE
2010
IEEE
15 years 4 months ago
2010
IEEE
The design and first measuring results of an ultra-low power 12bit Successive-Approximation ADC for autonomous multi-sensor systems are presented. The comparator and the DAC are o...