452 search results - page 11 / 91 » date 2010 |
DATE
2010
IEEE
15 years 4 months ago
2010
IEEE
— This paper introduces the concept of kl-feasible cuts, by controlling both the number k of inputs and the number l of outputs in a circuit cut. To provide scalability, the conc...
DATE
2010
IEEE
15 years 4 months ago
2010
IEEE
—Many systems are based on embedded microcontrollers. Applications demand for production and Power-On testing, including memory testing. Because low-end microcontrollers may not ...
DATE
2010
IEEE
15 years 4 months ago
2010
IEEE
Adaptive testing is a generic term for a number of techniques which aim at improving the test quality and/or reducing the test application costs. In adaptive tests, the test conte...
DATE
2010
IEEE
15 years 1 months ago
2010
IEEE
Abstract--This paper presents a method for automatic microarchitectural pipelining of systems with loops. The original specification is pipelined by performing provably-correct tra...
DATE
2010
IEEE
14 years 9 months ago
2010
IEEE
In this paper, we propose a binary-tree waveguide connected Optical-Network-on-Chip (ONoC) to accelerate the establishment of the lightpath. By broadcasting the control data in the...