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DATE
2010
IEEE
15 years 4 months ago
2010
IEEE
—This paper presents a methodology to evaluate and optimize the robustness of an embedded system in terms of invariability in case of design revisions. Early decisions in embedde...
DATE
2010
IEEE
15 years 4 months ago
2010
IEEE
—Parallel file systems are very sensitive to adverse conditions, and the lack of synergy between such file systems and some of the applications running on them has a negative i...
DATE
2010
IEEE
15 years 4 months ago
2010
IEEE
When testing delay faults on critical paths, conventional structural test patterns may be applied in functionally-unreachable states, leading to over-testing or under-testing of t...
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DATE
2010
IEEE
15 years 2 months ago
2010
IEEE
Various X-filling methods have been proposed for reducing the shift and/or capture power in scan testing. The main drawback of these methods is that X-filling for low power leads t...
DATE
2010
IEEE
15 years 4 months ago
2010
IEEE
—Creating latency insensitive or asynchronous designs from clocked designs has potential benefits of increased modularity and robustness to variations. Several transformations h...