452 search results - page 31 / 91 » date 2010 |
DATE
2010
IEEE
15 years 5 months ago
2010
IEEE
—With the advancement of CMOS manufacturing process to nano-scale, future shipped microprocessors will be increasingly vulnerable to intermittent faults. Quantitatively character...
DATE
2010
IEEE
15 years 5 months ago
2010
IEEE
—Temperature has a strong influence on integrated circuit (IC) performance, power consumption, and reliability. However, accurate thermal analysis can impose high computation co...
DATE
2010
IEEE
15 years 5 months ago
2010
IEEE
— We discuss a fault diagnosis scheme for analog integrated circuits. Our approach is based on an assemblage of learning machines that are trained beforehand to guide us through ...
DATE
2010
IEEE
15 years 5 months ago
2010
IEEE
: Scaling down in very deep submicron (VDSM) technologies increases the delay, power consumption of on-chip interconnects, while the reliability and yield decrease. In high perform...
DATE
2010
IEEE
15 years 5 months ago
2010
IEEE
Abstract—We present a throughput-driven partitioning algorithm and a throughput-preserving merging algorithm for the high-level physical synthesis of latency-insensitive (LI) sys...