452 search results - page 33 / 91 » date 2010 |
DATE
2010
IEEE
15 years 5 months ago
2010
IEEE
To meet customer’s product-quality expectations, each individual IC needs to be tested for manufacturing defects incurred during its many high-precision, and hence defect-prone ...
DATE
2010
IEEE
15 years 5 months ago
2010
IEEE
—Fault tolerance (FT) has become a major concern in computing systems. Instruction duplication has been proposed to verify application execution at run time. Two techniques, inst...
DATE
2010
IEEE
15 years 5 months ago
2010
IEEE
— Pattern recognition has many applications in design automation. A generalized pattern recognition algorithm is presented in this paper which can efficiently extract similar pat...
DATE
2010
IEEE
15 years 5 months ago
2010
IEEE
—The admission control problem is concerned with determining whether a new task may be accepted by a system consisting of a set of running tasks, such that the already admitted a...
DATE
2010
IEEE
15 years 5 months ago
2010
IEEE
— This paper describes a Model Order Reduction algorithm for multi-dimensional parameterized systems, based on a sampling procedure which incorporates a low order moment matching...