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DFT
1994
IEEE
15 years 10 months ago
1994
IEEE
132
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EURODAC
1994
IEEE
15 years 10 months ago
1994
IEEE
Undetectable shorts may decrease the long term reliability of a circuit, cause intermittent failures, add noise and delay, or increase test pattern generation costs. This paper de...
149
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DAC
1994
ACM
15 years 10 months ago
1994
ACM
A low overhead DFT technique, called clock-grouping, for delay testing of sequential synchronous circuits is presented. The proposed technique increases robust path delay fault co...
152
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DFT
1994
IEEE
15 years 10 months ago
1994
IEEE
The 1: track model for fault tolerant 2 0 processor arrays is extended to 30 mesh architectures. Non-intersecting, continuous, straight and non-near miss compensation paths are co...