This paper presents a testability improvement method for digital systems described in VHDL behavioral specification. The method is based on testability analysis at registertransfe...
- This paper presents a non-scan design-for-testability technique applicable to register-transfer(RT) level data path circuits, which are usually very hard-to-test due to the prese...
This paper illustrates the advantages of using the Discrete Cosine Transform (DCT) as compared to the standard Discrete Fourier Transform (DFT) for the purpose of removing noise e...