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DFT
2007
IEEE
15 years 6 months ago
2007
IEEE
Solid-state image sensors develop in-field defects in all common environments. Experiments have demonstrated the growth of significant quantities of hot-pixel defects that degrade...
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DFT
2007
IEEE
15 years 6 months ago
2007
IEEE
During semiconductor manufacturing, particles undesirably depose on the surface of the wafer causing “open” and “short” defects to interconnects. In this paper, a third ty...
109
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DFT
2007
IEEE
15 years 6 months ago
2007
IEEE
Many side-channel attacks on implementations of cryptographic algorithms have been developed in recent years demonstrating the ease of extracting the secret key. In response, vari...
DFT
2007
IEEE
15 years 6 months ago
2007
IEEE
The network-on-chip (NoC) paradigm is seen as a way of facilitating the integration of a large number of computational and storage blocks on a chip to meet several performance and...
DFT
2007
IEEE
15 years 6 months ago
2007
IEEE
Growth of pixel density and sensor array size increases the likelihood of developing in-field pixel defects. An ongoing study on defect development in imagers has now provided us ...