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    EMISAIJ
    2011
    125views more  EMISAIJ 2011»
    Detecting Common Errors in Event-Driven Process Chains by Label Analysis
    14 years 10 months ago
    Detecting Common Errors in Event-Driven Process Chains by Label Analysis
    Download  ebus.informatik.uni-leipzig.de
    Volker Gruhn, Ralf Laue
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