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ETS
2006
IEEE
14 years 9 months ago
2006
IEEE
ET
2007
14 years 9 months ago
2007
In this paper, testing of radio frequency (RF) devices with mixed-signal testers is discussed. General purpose automatic test equipment (ATE) will be used for this. A global posit...
ET
2000
14 years 9 months ago
2000
An efficient deterministic BIST scheme based on partial scan chains together with a scan selection algorithm tailored for BIST is presented. The algorithm determines a minimum num...
ET
2010
14 years 8 months ago
2010
—Designers often apply manual or semi-automatic loop and data transformations on array and loop intensive programs to improve performance. For the class of static affine program...
FUIN
2007
14 years 9 months ago
2007
We present the development of a theory of stored threads and their execution. The work builds upon Maurer’s theory of computer instructions and the thread algebra of Bergstra et ...