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ETS
2006
IEEE
15 years 1 months ago
2006
IEEE
Online repair through reconfiguration is a particularly advantageous approach in the nanoelectronic environment since reconfigurability is naturally supported by the devices. Howe...
ETS
2006
IEEE
15 years 3 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
ETS
2006
IEEE
15 years 3 months ago
2006
IEEE
The Networks-on-Chip (NoCs) paradigm is emerging as a solution for the communication of SoCs. Many NoC architecture propositions are presented but few works on testing these netwo...
ETS
2006
IEEE
15 years 3 months ago
2006
IEEE
The application of Dynamic Voltage Scaling (DVS) to reduce energy consumption may have a detrimental impact on the quality of manufacturing tests employed to detect permanent faul...
ETS
2006
IEEE
14 years 9 months ago
2006
IEEE
Typically, most research and academic institutions own and archive a great amount of objects and research related resources that have been produced, used and maintained over long ...