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ET
2010
62views more  ET 2010»
15 years 1 months ago
RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences
Hongxia Fang, Krishnendu Chakrabarty, Hideo Fujiwa...
ET
2010
60views more  ET 2010»
15 years 1 months ago
Using Stochastic Differential Equation for Verification of Noise in Analog/RF Circuits
Rajeev Narayanan, Mohamed H. Zaki, Sofiène ...