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COLING
2010
14 years 9 months ago
Reply to Rao et al. and Lee et al
Richard Sproat
96
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ET
2010
62views more  ET 2010»
14 years 11 months ago
RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences
Hongxia Fang, Krishnendu Chakrabarty, Hideo Fujiwa...
98
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ET
2010
60views more  ET 2010»
14 years 11 months ago
Using Stochastic Differential Equation for Verification of Noise in Analog/RF Circuits
Rajeev Narayanan, Mohamed H. Zaki, Sofiène ...
BISE
2010
90views more  BISE 2010»
15 years 16 days ago
Letter to the Editor: Statements on the Contribution by Urbach et al. from Issue 4/2009
Hans Ulrich Buhl, Peter Mertens, Matthias Schumann...