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ET
2010
62views more  ET 2010»
14 years 10 months ago
RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences
Hongxia Fang, Krishnendu Chakrabarty, Hideo Fujiwa...
ET
2010
60views more  ET 2010»
14 years 10 months ago
Using Stochastic Differential Equation for Verification of Noise in Analog/RF Circuits
Rajeev Narayanan, Mohamed H. Zaki, Sofiène ...
BISE
2010
90views more  BISE 2010»
14 years 12 months ago
Letter to the Editor: Statements on the Contribution by Urbach et al. from Issue 4/2009
Hans Ulrich Buhl, Peter Mertens, Matthias Schumann...