818 search results - page 111 / 164 » formats 2007 |
DFT
2007
IEEE
15 years 4 months ago
2007
IEEE
During semiconductor manufacturing, particles undesirably depose on the surface of the wafer causing “open” and “short” defects to interconnects. In this paper, a third ty...
GLOBECOM
2007
IEEE
15 years 4 months ago
2007
IEEE
—Comprehensive performance analysis of the unordered V-BLAST algorithm with various power allocation strategies is presented, which makes use of analytical tools and resorts to M...
GLOBECOM
2007
IEEE
15 years 4 months ago
2007
IEEE
—The current trends in service consolidation over Internet Protocol (IP) also stimulates the integration of the industrial automation system with the information technology (IT) ...
HASE
2007
IEEE
15 years 4 months ago
2007
IEEE
Fault Tree Analysis (FTA) is a safety-analysis technique that has been recently extended to accommodate product-line engineering for critical domains. This paper describes a tool-...
HICSS
2007
IEEE
15 years 4 months ago
2007
IEEE
Consideration of cost and resource benefits generated from an alliance have prevailed the theoretical and empirical research about strategic alliances and value networks/ webs. As...